Uicheul Yoon, Jong-Min Lee, Kiho Im, Yong-Wook Shin, Baek Hwan Cho, In-Young Kim, Jun Soo Kwon, Sun I. Kim. Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia. NeuroImage, 34(4):1405-1415, 2007. [doi]
Abstract is missing.