A layout checking system for large scale integrated circuits - researchr publication authors

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Kenji Yoshida, Takashi Mitsuhashi, Yasuo Nakada, Toshiaki Chiba, Kiyoshi Ogita, Shinji Nakatsuka. A layout checking system for large scale integrated circuits. In Judith G. Brinsfield, Stephen A. Szygenda, David W. Hightower, editors, Proceedings of the 14th Design Automation Conference, DAC '77, New Orleans, Louisiana, USA, June 20-22, 1977. pages 322-330, ACM, 1977. [doi]

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