A New Approach for Low Power Scan Testing - researchr publication authors

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Takaki Yoshida, Masafumi Watari. A New Approach for Low Power Scan Testing. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 480-487, IEEE Computer Society, 2003. [doi]

This author has not been identified. Look up 'Takaki Yoshida' in GoogleThis author has not been identified. Look up 'Masafumi Watari' in Google

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