Takaki Yoshida, Masafumi Watari. A New Approach for Low Power Scan Testing. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 480-487, IEEE Computer Society, 2003. [doi]
@inproceedings{YoshidaW03,
title = {A New Approach for Low Power Scan Testing},
author = {Takaki Yoshida and Masafumi Watari},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630480abs.htm},
tags = {testing, systematic-approach},
researchr = {https://researchr.org/publication/YoshidaW03},
cites = {0},
citedby = {0},
pages = {480-487},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}