Neutron-induced soft error rate estimation for SRAM using PHITS

Shusuke Yoshimoto, Takuro Amashita, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto. Neutron-induced soft error rate estimation for SRAM using PHITS. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 138-141, IEEE Computer Society, 2012. [doi]

Authors

Shusuke Yoshimoto

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Takuro Amashita

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Masayoshi Yoshimura

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Yusuke Matsunaga

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Hiroto Yasuura

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Shintaro Izumi

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Hiroshi Kawaguchi

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Masahiko Yoshimoto

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