Shusuke Yoshimoto, Takuro Amashita, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto. Neutron-induced soft error rate estimation for SRAM using PHITS. In 18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012. pages 138-141, IEEE Computer Society, 2012. [doi]
@inproceedings{YoshimotoAYMYIKY12,
title = {Neutron-induced soft error rate estimation for SRAM using PHITS},
author = {Shusuke Yoshimoto and Takuro Amashita and Masayoshi Yoshimura and Yusuke Matsunaga and Hiroto Yasuura and Shintaro Izumi and Hiroshi Kawaguchi and Masahiko Yoshimoto},
year = {2012},
doi = {10.1109/IOLTS.2012.6313859},
url = {http://doi.ieeecomputersociety.org/10.1109/IOLTS.2012.6313859},
researchr = {https://researchr.org/publication/YoshimotoAYMYIKY12},
cites = {0},
citedby = {0},
pages = {138-141},
booktitle = {18th IEEE International On-Line Testing Symposium, IOLTS 2012, Sitges, Spain, June 27-29, 2012},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-2082-5},
}