Masayoshi Yoshimura, Yusuke Akamine, Yusuke Matsunaga. A Soft Error Tolerance Estimation Method for Sequential Circuits. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 268-276, IEEE, 2011. [doi]
@inproceedings{YoshimuraAM11,
title = {A Soft Error Tolerance Estimation Method for Sequential Circuits},
author = {Masayoshi Yoshimura and Yusuke Akamine and Yusuke Matsunaga},
year = {2011},
doi = {10.1109/DFT.2011.22},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2011.22},
researchr = {https://researchr.org/publication/YoshimuraAM11},
cites = {0},
citedby = {0},
pages = {268-276},
booktitle = {2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1713-0},
}