Masayoshi Yoshimura, Yusuke Akamine, Yusuke Matsunaga. A Soft Error Tolerance Estimation Method for Sequential Circuits. In 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2011, Vancouver, BC, Canada, October 3-5, 2011. pages 268-276, IEEE, 2011. [doi]
Abstract is missing.