Kentaro Yoshimura, Fumio Narisawa, Koji Hashimoto, Tohru Kikuno. FAVE: factor analysis based approach for detecting product line variability from change history. In Ahmed E. Hassan, Michele Lanza, Michael W. Godfrey, editors, Fith International Workshop on Mining Software Repositories, MSR 2008 (ICSE Workshop), Leipzig, Germany, May 10-11, 2008, Proceedings. pages 11-18, ACM, 2008. [doi]
Abstract is missing.