Shin Yoshizawa, Alexander G. Belyaev, Hans-Peter Seidel. Fast and robust detection of crest lines on meshes. In Leif Kobbelt, Vadim Shapiro, editors, Proceedings of the Ninth ACM Symposium on Solid and Physical Modeling 2005, Cambridge, Massachusetts, USA, June 13-15, 2005. pages 227-232, ACM, 2005. [doi]
Abstract is missing.