Hiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita. On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. In 2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia. pages 269-274, IEEE Computer Society, 2004. [doi]
@inproceedings{YotsuyanagiKNHK04,
title = {On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure},
author = {Hiroyuki Yotsuyanagi and Toshimasa Kuchii and Shigeki Nishikawa and Masaki Hashizume and Kozo Kinoshita},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/delta/2004/2081/00/20810269abs.htm},
tags = {rule-based},
researchr = {https://researchr.org/publication/YotsuyanagiKNHK04},
cites = {0},
citedby = {0},
pages = {269-274},
booktitle = {2nd IEEE International Workshop on Electronic Design, Test and Applications (DELTA 2004), 28-30 January 2004, Perth, Australia},
publisher = {IEEE Computer Society},
isbn = {0-7695-2081-2},
}