Hiroyuki Yotsuyanagi, Masayuki Yamamoto, Masaki Hashizume. Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops. IEICE Transactions, 93-D(1):10-16, 2010. [doi]
@article{YotsuyanagiYH10,
title = {Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops},
author = {Hiroyuki Yotsuyanagi and Masayuki Yamamoto and Masaki Hashizume},
year = {2010},
url = {http://search.ieice.org/bin/summary.php?id=e93-d_1_10},
tags = {testing},
researchr = {https://researchr.org/publication/YotsuyanagiYH10},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {93-D},
number = {1},
pages = {10-16},
}