Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops - researchr publication references

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Hiroyuki Yotsuyanagi, Masayuki Yamamoto, Masaki Hashizume. Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops. IEICE Transactions, 93-D(1):10-16, 2010. [doi]

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