Jaebeom You, Jaewon Lee, Sehun Lee, Hyuk-Yoon Kwon. From Data to Model in Bias: A Statistical Analysis of Political Bias in the C4 Corpus and Its Impact on LLMs. In Proceedings of the Nineteenth ACM International Conference on Web Search and Data Mining, WSDM 2026, Boise, ID, USA, February 22-26, 2026. pages 860-870, ACM, 2026. [doi]
Abstract is missing.