Deep Gaussian Process for Crop Yield Prediction Based on Remote Sensing Data - researchr publication authors

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Jiaxuan You, Xiaocheng Li, Melvin Low, David Lobell, Stefano Ermon. Deep Gaussian Process for Crop Yield Prediction Based on Remote Sensing Data. In Satinder P. Singh, Shaul Markovitch, editors, Proceedings of the Thirty-First AAAI Conference on Artificial Intelligence, February 4-9, 2017, San Francisco, California, USA. pages 4559-4566, AAAI Press, 2017. [doi]

This author has not been identified. Look up 'Jiaxuan You' in GoogleThis author has not been identified. Look up 'Xiaocheng Li' in GoogleThis author has not been identified. Look up 'Melvin Low' in GoogleThis author has not been identified. Look up 'David Lobell' in GoogleThis author has not been identified. Look up 'Stefano Ermon' in Google

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