Jiaxuan You, Xiaocheng Li, Melvin Low, David Lobell, Stefano Ermon. Deep Gaussian Process for Crop Yield Prediction Based on Remote Sensing Data. In Satinder P. Singh, Shaul Markovitch, editors, Proceedings of the Thirty-First AAAI Conference on Artificial Intelligence, February 4-9, 2017, San Francisco, California, USA. pages 4559-4566, AAAI Press, 2017. [doi]
Abstract is missing.