Oung Tak You, Dong-Sung Pae, Sung-Hee Kim, Kyeong Eun Kim, Myo-Taeg Lim, Tae-Koo Kang. Pattern matching for industrial object recognition using geometry-based vector mapping descriptors. Pattern Anal. Appl., 21(4):1167-1183, 2018. [doi]
Abstract is missing.