Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker. Electrical characterization and analysis techniques for the high-kappa era. Microelectronics Reliability, 47(4-5):479-488, 2007. [doi]
@article{YoungHNCLB07,
title = {Electrical characterization and analysis techniques for the high-kappa era},
author = {Chadwin D. Young and Dawei Heh and Arnost Neugroschel and Rino Choi and Byoung Hun Lee and Gennadi Bersuker},
year = {2007},
doi = {10.1016/j.microrel.2007.01.053},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.053},
tags = {analysis},
researchr = {https://researchr.org/publication/YoungHNCLB07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {4-5},
pages = {479-488},
}