Electrical characterization and analysis techniques for the high-kappa era

Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker. Electrical characterization and analysis techniques for the high-kappa era. Microelectronics Reliability, 47(4-5):479-488, 2007. [doi]

Abstract

Abstract is missing.