Flatbed scanner simulation to analyze the effect of detector's size on color artifacts - researchr publication authors

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Mohammed Yousefhussien, Roger L. Easton Jr., Raymond W. Ptucha, Mark Q. Shaw, Brent M. Bradburn, Jerry Wagner, David Larson, Eli Saber. Flatbed scanner simulation to analyze the effect of detector's size on color artifacts. In Charles A. Bouman, Ken D. Sauer, editors, Computational Imaging XIII, part of the IS&T-SPIE Electronic Imaging Symposium, San Francisco, California, United States, February 8, 2015, Proceedings. Volume 9401 of SPIE Proceedings, IS&T/SPIE, 2015. [doi]

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