Flatbed scanner simulation to analyze the effect of detector's size on color artifacts

Mohammed Yousefhussien, Roger L. Easton Jr., Raymond W. Ptucha, Mark Q. Shaw, Brent M. Bradburn, Jerry Wagner, David Larson, Eli Saber. Flatbed scanner simulation to analyze the effect of detector's size on color artifacts. In Charles A. Bouman, Ken D. Sauer, editors, Computational Imaging XIII, part of the IS&T-SPIE Electronic Imaging Symposium, San Francisco, California, United States, February 8, 2015, Proceedings. Volume 9401 of SPIE Proceedings, IS&T/SPIE, 2015. [doi]

@inproceedings{YousefhussienEP15,
  title = {Flatbed scanner simulation to analyze the effect of detector's size on color artifacts},
  author = {Mohammed Yousefhussien and Roger L. Easton Jr. and Raymond W. Ptucha and Mark Q. Shaw and Brent M. Bradburn and Jerry Wagner and David Larson and Eli Saber},
  year = {2015},
  doi = {10.1117/12.2083028},
  url = {http://dx.doi.org/10.1117/12.2083028},
  researchr = {https://researchr.org/publication/YousefhussienEP15},
  cites = {0},
  citedby = {0},
  booktitle = {Computational Imaging XIII, part of the IS&T-SPIE Electronic Imaging Symposium, San Francisco, California, United States, February 8, 2015, Proceedings},
  editor = {Charles A. Bouman and Ken D. Sauer},
  volume = {9401},
  series = {SPIE Proceedings},
  publisher = {IS&T/SPIE},
}