Bai Yu, Mohammed Alawad, Mingjie Lin. Optimally mitigating BTI-induced FPGA device aging with discriminative voltage scaling (abstract only). In Vaughn Betz, George A. Constantinides, editors, The 2014 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays, FPGA '14, Monterey, CA, USA - February 26 - 28, 2014. pages 246, ACM, 2014. [doi]
Abstract is missing.