Xiaochun Yu, R. D. (Shawn) Blanton. Statistical defect-detection analysis of test sets using readily-available tester data. In 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, California, USA, November 7-10, 2011. pages 768-773, IEEE, 2011. [doi]
@inproceedings{YuB11-6,
title = {Statistical defect-detection analysis of test sets using readily-available tester data},
author = {Xiaochun Yu and R. D. (Shawn) Blanton},
year = {2011},
doi = {10.1109/ICCAD.2011.6105416},
url = {http://dx.doi.org/10.1109/ICCAD.2011.6105416},
researchr = {https://researchr.org/publication/YuB11-6},
cites = {0},
citedby = {0},
pages = {768-773},
booktitle = {2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, California, USA, November 7-10, 2011},
publisher = {IEEE},
isbn = {978-1-4577-1399-6},
}