Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos. Pipeline ADC linearity testing with dramatically reduced data capture time. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 792-795, IEEE, 2005. [doi]
@inproceedings{YuCGP05,
title = {Pipeline ADC linearity testing with dramatically reduced data capture time},
author = {Zhongjun Yu and Degang Chen and Randall L. Geiger and Ioannis Papantonopoulos},
year = {2005},
doi = {10.1109/ISCAS.2005.1464707},
url = {http://dx.doi.org/10.1109/ISCAS.2005.1464707},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/YuCGP05},
cites = {0},
citedby = {0},
pages = {792-795},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan},
publisher = {IEEE},
}