Xinhai Yu, ChangChun Chai, Yang Liu, Yintang Yang, Qingyang Fan. Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs. Microelectronics Reliability, 55(8):1174-1179, 2015. [doi]
@article{YuCLYF15,
title = {Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs},
author = {Xinhai Yu and ChangChun Chai and Yang Liu and Yintang Yang and Qingyang Fan},
year = {2015},
doi = {10.1016/j.microrel.2015.06.002},
url = {http://dx.doi.org/10.1016/j.microrel.2015.06.002},
researchr = {https://researchr.org/publication/YuCLYF15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {8},
pages = {1174-1179},
}