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Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs

Xinhai Yu, ChangChun Chai, Yang Liu, Yintang Yang, Qingyang Fan. Analysis of high power microwave induced degradation and damage effects in AlGaAs/InGaAs pHEMTs. Microelectronics Reliability, 55(8):1174-1179, 2015. [doi]

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