Jing Yu, Yao Fu, Yanan Zheng, Zheng Wang, Xiaojun Ye. Test4Deep: an Effective White-Box Testing for Deep Neural Networks. In Meikang Qiu, editor, 2019 IEEE International Conference on Computational Science and Engineering, CSE 2019, and IEEE International Conference on Embedded and Ubiquitous Computing, EUC 2019, New York, NY, USA, August 1-3, 2019. pages 16-23, IEEE, 2019. [doi]
Abstract is missing.