Modified Bayesian D-Optimality for Accelerated Degradation Test Design With Model Uncertainty

Yong Yu, Changhua Hu, Xiao-Sheng Si, Jianxun Zhang. Modified Bayesian D-Optimality for Accelerated Degradation Test Design With Model Uncertainty. IEEE Access, 7:42181-42189, 2019. [doi]

Authors

Yong Yu

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Changhua Hu

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Xiao-Sheng Si

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Jianxun Zhang

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