Modified Bayesian D-Optimality for Accelerated Degradation Test Design With Model Uncertainty

Yong Yu, Changhua Hu, Xiao-Sheng Si, Jianxun Zhang. Modified Bayesian D-Optimality for Accelerated Degradation Test Design With Model Uncertainty. IEEE Access, 7:42181-42189, 2019. [doi]

@article{YuHSZ19,
  title = {Modified Bayesian D-Optimality for Accelerated Degradation Test Design With Model Uncertainty},
  author = {Yong Yu and Changhua Hu and Xiao-Sheng Si and Jianxun Zhang},
  year = {2019},
  doi = {10.1109/ACCESS.2019.2906914},
  url = {https://doi.org/10.1109/ACCESS.2019.2906914},
  researchr = {https://researchr.org/publication/YuHSZ19},
  cites = {0},
  citedby = {0},
  journal = {IEEE Access},
  volume = {7},
  pages = {42181-42189},
}