Yanbing Yu, James A. Jones, Mary Jean Harrold. An empirical study of the effects of test-suite reduction on fault localization. In Wilhelm Schäfer, Matthew B. Dwyer, Volker Gruhn, editors, 30th International Conference on Software Engineering (ICSE 2008), Leipzig, Germany, May 10-18, 2008. pages 201-210, ACM, 2008. [doi]
@inproceedings{YuJH08,
title = {An empirical study of the effects of test-suite reduction on fault localization},
author = {Yanbing Yu and James A. Jones and Mary Jean Harrold},
year = {2008},
doi = {10.1145/1368088.1368116},
url = {http://doi.acm.org/10.1145/1368088.1368116},
tags = {empirical, testing},
researchr = {https://researchr.org/publication/YuJH08},
cites = {0},
citedby = {0},
pages = {201-210},
booktitle = {30th International Conference on Software Engineering (ICSE 2008), Leipzig, Germany, May 10-18, 2008},
editor = {Wilhelm Schäfer and Matthew B. Dwyer and Volker Gruhn},
publisher = {ACM},
isbn = {978-1-60558-079-1},
}