Yanbing Yu, James A. Jones, Mary Jean Harrold. An empirical study of the effects of test-suite reduction on fault localization. In Wilhelm Schäfer, Matthew B. Dwyer, Volker Gruhn, editors, 30th International Conference on Software Engineering (ICSE 2008), Leipzig, Germany, May 10-18, 2008. pages 201-210, ACM, 2008. [doi]
Abstract is missing.