Yang Yu, Yueming Jiang, Xiyuan Peng. Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model. IEEE Access, 6:34724-34735, 2018. [doi]
@article{YuJP18,
title = {Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model},
author = {Yang Yu and Yueming Jiang and Xiyuan Peng},
year = {2018},
doi = {10.1109/ACCESS.2018.2849697},
url = {https://doi.org/10.1109/ACCESS.2018.2849697},
researchr = {https://researchr.org/publication/YuJP18},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {6},
pages = {34724-34735},
}