Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model

Yang Yu, Yueming Jiang, Xiyuan Peng. Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model. IEEE Access, 6:34724-34735, 2018. [doi]

Abstract

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