Yield-aware analog integrated circuit optimization using geostatistics motivated performance modeling

Guo Yu, Peng Li. Yield-aware analog integrated circuit optimization using geostatistics motivated performance modeling. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 464-469, IEEE, 2007. [doi]

@inproceedings{YuL07:10,
  title = {Yield-aware analog integrated circuit optimization using geostatistics motivated performance modeling},
  author = {Guo Yu and Peng Li},
  year = {2007},
  doi = {10.1145/1326073.1326169},
  url = {http://doi.acm.org/10.1145/1326073.1326169},
  tags = {optimization, modeling, context-aware},
  researchr = {https://researchr.org/publication/YuL07%3A10},
  cites = {0},
  citedby = {0},
  pages = {464-469},
  booktitle = {2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA},
  editor = {Georges G. E. Gielen},
  publisher = {IEEE},
  isbn = {1-4244-1382-6},
}