Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation

JeongSang Yu, Jun-Hee Lee, EungTae Kim. Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation. IEEE Access, 14:86257-86272, 2026. [doi]

Abstract

Abstract is missing.