Xiao Yu, Jin Liu 0016, Jacky Wai Keung, Qing Li 0001, Kwabena Ebo Bennin, Zhou Xu, Junping Wang, Xiaohui Cui. Improving Ranking-Oriented Defect Prediction Using a Cost-Sensitive Ranking SVM. IEEE Transactions on Reliability, 69(1):139-153, 2020. [doi]
Abstract is missing.