Delving into Noisy Label Detection with Clean Data

Chenglin Yu, Xinsong Ma, Weiwei Liu 0003. Delving into Noisy Label Detection with Clean Data. In Andreas Krause 0001, Emma Brunskill, KyungHyun Cho, Barbara Engelhardt, Sivan Sabato, Jonathan Scarlett, editors, International Conference on Machine Learning, ICML 2023, 23-29 July 2023, Honolulu, Hawaii, USA. Volume 202 of Proceedings of Machine Learning Research, pages 40290-40305, PMLR, 2023. [doi]

Abstract

Abstract is missing.