NBTI and HCI Aging Prediction and Reliability Screening During Production Test

Liting Yu, Jianguo Ren, Xian Lu, Xiaoxiao Wang. NBTI and HCI Aging Prediction and Reliability Screening During Production Test. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):3000-3011, 2020. [doi]

Authors

Liting Yu

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Jianguo Ren

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Xian Lu

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Xiaoxiao Wang

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