Learning to Detect Multiple Photographic Defects - researchr publication authors

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Ning Yu, Xiaohui Shen, Zhe L. Lin, Radomír Mech, Connelly Barnes. Learning to Detect Multiple Photographic Defects. In 2018 IEEE Winter Conference on Applications of Computer Vision, WACV 2018, Lake Tahoe, NV, USA, March 12-15, 2018. pages 1387-1396, IEEE Computer Society, 2018. [doi]

This author has not been identified. Look up 'Ning Yu' in GoogleThis author has not been identified. Look up 'Xiaohui Shen' in GoogleThis author has not been identified. Look up 'Zhe L. Lin' in GoogleThis author has not been identified. Look up 'Radomír Mech' in GoogleThis author has not been identified. Look up 'Connelly Barnes' in Google

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