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Learning to Detect Multiple Photographic Defects

Ning Yu, Xiaohui Shen, Zhe L. Lin, Radomír Mech, Connelly Barnes. Learning to Detect Multiple Photographic Defects. In 2018 IEEE Winter Conference on Applications of Computer Vision, WACV 2018, Lake Tahoe, NV, USA, March 12-15, 2018. pages 1387-1396, IEEE Computer Society, 2018. [doi]

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