Honggang Yu, Haoqi Shan, Maximillian Panoff, Yier Jin. Cross-Device Profiled Side-Channel Attacks using Meta-Transfer Learning. In 58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021. pages 703-708, IEEE, 2021. [doi]
@inproceedings{YuSPJ21,
title = {Cross-Device Profiled Side-Channel Attacks using Meta-Transfer Learning},
author = {Honggang Yu and Haoqi Shan and Maximillian Panoff and Yier Jin},
year = {2021},
doi = {10.1109/DAC18074.2021.9586100},
url = {https://doi.org/10.1109/DAC18074.2021.9586100},
researchr = {https://researchr.org/publication/YuSPJ21},
cites = {0},
citedby = {0},
pages = {703-708},
booktitle = {58th ACM/IEEE Design Automation Conference, DAC 2021, San Francisco, CA, USA, December 5-9, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3274-0},
}