A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images - researchr publication authors

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Zifan Yu, Bruno Machado Trindade, Michael Green, Zhikang Zhang, Pullela Sneha, Erfan Bank-Tavakoli, Christopher Pawlowicz, Fengbo Ren. A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images. In 2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022. pages 2851-2855, IEEE, 2022. [doi]

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