A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images

Zifan Yu, Bruno Machado Trindade, Michael Green, Zhikang Zhang, Pullela Sneha, Erfan Bank-Tavakoli, Christopher Pawlowicz, Fengbo Ren. A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images. In 2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022. pages 2851-2855, IEEE, 2022. [doi]

@inproceedings{YuTGZSTPR22,
  title = {A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images},
  author = {Zifan Yu and Bruno Machado Trindade and Michael Green and Zhikang Zhang and Pullela Sneha and Erfan Bank-Tavakoli and Christopher Pawlowicz and Fengbo Ren},
  year = {2022},
  doi = {10.1109/ICIP46576.2022.9897544},
  url = {https://doi.org/10.1109/ICIP46576.2022.9897544},
  researchr = {https://researchr.org/publication/YuTGZSTPR22},
  cites = {0},
  citedby = {0},
  pages = {2851-2855},
  booktitle = {2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-9620-9},
}