Zhiyang Yu, Xiaojun Wu, Xiaodong Gu. Fully Convolutional Networks for Surface Defect Inspection in Industrial Environment. In Ming Liu 0001, Haoyao Chen, Markus Vincze, editors, Computer Vision Systems - 11th International Conference, ICVS 2017, Shenzhen, China, July 10-13, 2017, Revised Selected Papers. Volume 10528 of Lecture Notes in Computer Science, pages 417-426, Springer, 2017. [doi]
Abstract is missing.