CRRC: Coordinating Retention Errors, Read Disturb Errors and Huffman Coding on TLC NAND Flash Memory

Ta-Ching Yu, Chin-Hsien Wu, Yan-Qi Liao. CRRC: Coordinating Retention Errors, Read Disturb Errors and Huffman Coding on TLC NAND Flash Memory. IEEE Trans. Dependable Sec. Comput., 20(3):2208-2220, May - June 2023. [doi]

Abstract

Abstract is missing.