Dongzhe Yu, Han Wang, Jiangtao Xu. Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation. J. Electronic Testing, 36(3):365-374, 2020. [doi]
@article{YuWX20-0,
title = {Impact of Worst-Case Excitation for DDR interface Signal and Power Integrity Co-Simulation},
author = {Dongzhe Yu and Han Wang and Jiangtao Xu},
year = {2020},
doi = {10.1007/s10836-020-05875-4},
url = {https://doi.org/10.1007/s10836-020-05875-4},
researchr = {https://researchr.org/publication/YuWX20-0},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {36},
number = {3},
pages = {365-374},
}