A closed-form trapped-charge-included drain current compact model for amorphous oxide semiconductor thin-film transistors - researchr publication

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Fei Yu, Chuanzhong Xu, Gongyi Huang, Wei Lin, Tsair-Chun Liang. A closed-form trapped-charge-included drain current compact model for amorphous oxide semiconductor thin-film transistors. Microelectronics Reliability, 91:307-312, 2018. [doi]

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