Multiscan-based Test Data Compression Using UBI Dictionary and Bitmask

Yang Yu, Gang Xi, Liyan Qiao. Multiscan-based Test Data Compression Using UBI Dictionary and Bitmask. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 279-284, IEEE Computer Society, 2011. [doi]

Authors

Yang Yu

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Gang Xi

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Liyan Qiao

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