Test Scenario Generation Method Based on the Extended Activity Diagram

Fei Yu, Jiaxi Xu, Jingwei Shang. Test Scenario Generation Method Based on the Extended Activity Diagram. In 25th International Conference on Software Quality, Reliability, and Security, QRS 2025 - Companion, Hangzhou, China, July 16-20, 2025. pages 796-797, IEEE, 2025. [doi]

Abstract

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