Classification of Mixed-Type Defects in Wafer Bin Maps Utilizing the Quantum Approximate Optimization Algorithm

Qingqing Yu, Yinhui Yu. Classification of Mixed-Type Defects in Wafer Bin Maps Utilizing the Quantum Approximate Optimization Algorithm. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 109(1):26-34, 2026. [doi]

Abstract

Abstract is missing.